Depairing critical currents and self-magnetic field effects in submicron YBa2Cu3O7–d microbridges and bicrystal junctions
DOI (Low Temperature Physics):
https://doi.org/10.1063/1.1645178Ключові слова:
PACS: 74.60.Jg, 74.60.Ec, 74.72.BkАнотація
We report on depairing critical currents in submicron YBa2Cu3O7–d microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S–S' –S nature of the small-angle grain boundary junction.
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Опубліковано
2004-01-29
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Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov, and A.Ya. Tzalenchuk, Depairing critical currents and self-magnetic field effects in submicron YBa2Cu3O7–d microbridges and bicrystal junctions, Low Temp. Phys. 30, (2004) [Fiz. Nizk. Temp. 30, 276-281, (2004)] DOI: https://doi.org/10.1063/1.1645178.
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Надпровідність, зокрема високотемпературна
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