Depairing critical currents and self-magnetic field effects in submicron YBa2Cu3O7–d microbridges and bicrystal junctions

Автор(и)

  • Z.G. Ivanov Department of Physics, Chalmers University of Technology and University of Göteborg S-412 96 Göteborg, Sweden
  • N.Ya. Fogel Solid State Institute, Technion 32100, Haifa, Israel
  • O.I. Yuzephovich Department of Physics, Chalmers University of Technology and University of Göteborg S-412 96 Göteborg, Sweden
  • E.A. Stepantsov B.Verkin Institute for Low Temperature Physics and Engineering National Academy of Sciences of Ukraine, 47 Lenin Ave., Kharkov 61103, Ukraine
  • A.Ya. Tzalenchuk B.Verkin Institute for Low Temperature Physics and Engineering National Academy of Sciences of Ukraine, 47 Lenin Ave., Kharkov 61103, Ukraine

DOI:

https://doi.org/10.1063/1.1645178

Ключові слова:

PACS: 74.60.Jg, 74.60.Ec, 74.72.Bk

Анотація

We report on depairing critical currents in submicron YBa2Cu3O7–d microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S–S' –S nature of the small-angle grain boundary junction.

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Опубліковано

2004-01-29

Як цитувати

(1)
Ivanov, Z.; Fogel, N.; Yuzephovich, O.; Stepantsov, E.; Tzalenchuk, A. Depairing Critical Currents and Self-Magnetic Field Effects in Submicron YBa2Cu3O7–d Microbridges and Bicrystal Junctions. Fiz. Nizk. Temp. 2004, 30, 276-281.

Номер

Том 30 № 3 (2004)

Розділ

Надпровідність, зокрема високотемпературна

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