Microwave properties of HTS films: measurements in millimeter wave range

Experimental Methods and Applications

Автор(и)

  • N.T. Cherpak A. Usikov Institute of Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12 Acad. Proskura Str., Kharkov 61085, Ukraine
  • A.A. Barannik A. Usikov Institute of Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12 Acad. Proskura Str., Kharkov 61085, Ukraine
  • Yu.V. Prokopenko A. Usikov Institute of Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12 Acad. Proskura Str., Kharkov 61085, Ukraine
  • Yu.F. Filipov A. Usikov Institute of Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12 Acad. Proskura Str., Kharkov 61085, Ukraine
  • S.A. Vitusevich Institut für Schichten und Grenzfl&aml;chen and Center of Nanoelectronic Systems for Information Technology, Forschungszentrum Jülich,1 Leo-Brandt-Strasse, Jülich, 52425 Germany

DOI:

https://doi.org/10.1063/1.2215377

Ключові слова:

microwave surface impedance, high-temperature superconductors, film, whispering gallery mode dielectric resonator.

Анотація

A theoretical and experimental justification of an approach proposed and developed by us for surface impedance standard measurements of HTS films is presented. An analysis of the electromagnetic properties of quasi-optical dielectric resonators with conducting endplates, which provides a theoretical background for studies of HTS films in the millimeter wave range, is performed. With this technique, the highest quality modes, namely whispering gallery modes, are excited in a dielectric cylindrical disc sandwiched between HTS films. Considerable enhancement of the sensitivity of surface resistance measurements in the millimeter wave range is demonstrated, which is important for the fundamental investigation of superconductor physics. It is also shown that the measured frequency shift in the resonator with the HTS endplates as a function of the temperature reveals a possibility for accurate evaluation of the field penetration depth in HTS films.

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Опубліковано

2006-04-21

Як цитувати

(1)
Cherpak, N.; Barannik, A.; Prokopenko, Y.; Filipov, Y.; Vitusevich, S. Microwave Properties of HTS Films: Measurements in Millimeter Wave Range: Experimental Methods and Applications. Fiz. Nizk. Temp. 2006, 32, 795-801.

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