Electronic spin working mechanically (Review Article)

Автор(и)

  • R.I. Shekhter Department of Physics, University of Gothenburg, SE-412 96 Göteborg, Sweden
  • L.Y. Gorelik Department of Applied Physics, Chalmers University of Technology, SE-412 96 Göteborg, Sweden
  • I.V. Krive B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine
  • M.N. Kiselev Physical Department, V.N. Karazin National University, Kharkov 61077, Ukraine
  • S.I. Kulinich B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine
  • A.V. Parafilo B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine
  • K. Kikoin The Abdus Salam International Centre for Theoretical Physics, Strada Costiera 11, Trieste 1-34151, Italy
  • M. Jonson Department of Physics, University of Gothenburg, SE-412 96 Göteborg, Sweden

DOI (Low Temperature Physics):


https://doi.org/10.1063/1.4887060%20

Ключові слова:

electron-spin dynamics, single-electron shuttle, Kondo effect.

Анотація

A single-electron tunneling (SET) device with a nanoscale central island that can move with respect to the bulk source- and drain electrodes allows for a nanoelectromechanical (NEM) coupling between the electrical current through the device and mechanical vibrations of the island. Although an electromechanical “shuttle” instability and the associated phenomenon of single-electron shuttling were predicted more than 15 years ago, both theoretical and experimental studies of NEM-SET structures are still carried out. New functionalities based on quantum coherence, Coulomb correlations and coherent electron-spin dynamics are of particular current interest. In this article we present a short review of recent activities in this area.

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Опубліковано

2014-05-16

Як цитувати

(1)
R.I. Shekhter, L.Y. Gorelik, I.V. Krive, M.N. Kiselev, S.I. Kulinich, A.V. Parafilo, K. Kikoin, and M. Jonson, Electronic spin working mechanically (Review Article), Low Temp. Phys. 40, 600–614, (2014) [Fiz. Nizk. Temp. 40, 775-792, (2014)] DOI: https://doi.org/10.1063/1.4887060 .

Номер

Том 40 № 7 (2014)

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