Electronic spin working mechanically (Review Article)

Автор(и)

  • R.I. Shekhter Department of Physics, University of Gothenburg, SE-412 96 Göteborg, Sweden
  • L.Y. Gorelik Department of Applied Physics, Chalmers University of Technology, SE-412 96 Göteborg, Sweden
  • I.V. Krive B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine
  • M.N. Kiselev Physical Department, V.N. Karazin National University, Kharkov 61077, Ukraine
  • S.I. Kulinich B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine
  • A.V. Parafilo B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine
  • K. Kikoin The Abdus Salam International Centre for Theoretical Physics, Strada Costiera 11, Trieste 1-34151, Italy
  • M. Jonson Department of Physics, University of Gothenburg, SE-412 96 Göteborg, Sweden

DOI (Low Temperature Physics):


https://doi.org/10.1063/1.4887060%20

Ключові слова:

electron-spin dynamics, single-electron shuttle, Kondo effect.

Анотація

A single-electron tunneling (SET) device with a nanoscale central island that can move with respect to the bulk source- and drain electrodes allows for a nanoelectromechanical (NEM) coupling between the electrical current through the device and mechanical vibrations of the island. Although an electromechanical “shuttle” instability and the associated phenomenon of single-electron shuttling were predicted more than 15 years ago, both theoretical and experimental studies of NEM-SET structures are still carried out. New functionalities based on quantum coherence, Coulomb correlations and coherent electron-spin dynamics are of particular current interest. In this article we present a short review of recent activities in this area.

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Опубліковано

2014-05-16

Як цитувати

(1)
R.I. Shekhter, L.Y. Gorelik, I.V. Krive, M.N. Kiselev, S.I. Kulinich, A.V. Parafilo, K. Kikoin, and M. Jonson, Electronic spin working mechanically (Review Article), Low Temp. Phys. 40, (2014) [Fiz. Nizk. Temp. 40, 775-792, (2014)] DOI: https://doi.org/10.1063/1.4887060 .

Номер

Том 40 № 7 (2014)

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