Electron traps in solid Xe

Автор(и)

  • Ivan V. Khyzhniy B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine 47 Lenin Ave., Kharkov 61103, Ukraine
  • Sergey A. Uyutnov B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine 47 Lenin Ave., Kharkov 61103, Ukraine
  • Elena V. Savchenko B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine 47 Lenin Ave., Kharkov 61103, Ukraine
  • Galina B. Gumenchuk Lehrstuhl for Physicalische Chemie II TUM, 85747 Garching, Germany
  • Alexey N. Ponomaryov Lehrstuhl for Physicalische Chemie II TUM, 85747 Garching, Germany
  • Vladimir E. Bondybey Lehrstuhl for Physicalische Chemie II TUM, 85747 Garching, Germany

DOI:

https://doi.org/10.1063/1.3117964

Ключові слова:

rare gas solids, thermally stimulated luminescence, exoelectron emission, relaxation processes.

Анотація

Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects was estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve.

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Опубліковано

2009-03-04

Як цитувати

(1)
Khyzhniy, I. V.; Uyutnov, S. A.; Savchenko, E. V.; Gumenchuk, G. B.; Ponomaryov, A. N.; Bondybey, V. E. Electron Traps in Solid Xe. Fiz. Nizk. Temp. 2009, 35, 433-437.

Номер

Том 35 № 4 (2009)

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