Laser scanning microscopy of HTS films and devices
(Review Article)

Experimental Methods and Applications

Автор(и)

  • A.P. Zhuravel B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine, 47 Lenin Ave., Kharkov 61103, Ukraine
  • A.G. Sivakov B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine, 47 Lenin Ave., Kharkov 61103, Ukraine
  • O.G. Turutanov B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine, 47 Lenin Ave., Kharkov 61103, Ukraine
  • A.N. Omelyanchouk B. Verkin Institute for Low Temperature Physics and Engineering of the National Academy of Sciences of Ukraine, 47 Lenin Ave., Kharkov 61103, Ukraine
  • Steven M. Anlage Center for Superconductivity Research, Department of Physics, University of Maryland College Park, MD 20742-4111 USA
  • A. Lukashenko Physics Institute III, University of Erlangen-Nurnberg, Erlangen D-91058, Germany
  • A.V. Ustinov Physics Institute III, University of Erlangen-Nurnberg, Erlangen D-91058, Germany
  • D. Abraimov University of Wisconsin, Applied Superconductivity Center, Madison, Wisconsin 53706, USA

DOI:

https://doi.org/10.1063/1.2215376

Ключові слова:

Spatially-resolved imaging technique, laser scanning microscopy, high-Tc superconductivity, photoresponse, bolometric effect.

Анотація

The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high–Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, development of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven by LSM imaging.

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Дані завантаження ще не доступні.

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Опубліковано

2006-04-21

Як цитувати

(1)
Zhuravel, A.; Sivakov, A.; Turutanov, O.; Omelyanchouk, A.; Anlage, S. M.; Lukashenko, A.; Ustinov, A.; Abraimov, D. Laser Scanning Microscopy of HTS Films and devices
(Review Article): Experimental Methods and Applications. Fiz. Nizk. Temp. 2006, 32, 775-794.

Номер

Том 32 № 6 (2006)

Розділ

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