Orientational order parameter in a-N2 from x-ray data

Анотація

A method is suggested and validated for the deduction of orientational order parameter values h in molecular crystals consisting of diatomics directly from integrated x-ray diffraction intensities. This method is applied to pure solid nitrogen in its a phase. It is shown that to within a good accuracy the integrated intensity of a superstructure reflection is proportional to h². The h values determined from x-ray powder diffraction measurements agrees well with the values obtained by NQR and NMR.