Relaxation dynamics in the high-frequency crystal-field spectroscopy of PrNi5 point contacts

Автор(и)

  • O. P. Balkashin B. Verkin Institute for Low Temperature Physics and Engineering, National Academy of Science of Ukraine, 47 Lenin Ave., 310164 Kharkov, Ukraine
  • G. L. Sukhodub B. Verkin Institute for Low Temperature Physics and Engineering, National Academy of Science of Ukraine, 47 Lenin Ave., 310164 Kharkov, Ukraine
  • I. K. Yanson B. Verkin Institute for Low Temperature Physics and Engineering, National Academy of Science of Ukraine, 47 Lenin Ave., 310164 Kharkov, Ukraine
  • T. M. Brill Grenoble High Magnetic Field Laboratory, Max-Planck-Institute fur Festkorperforschung and Centre National de la Recherche Scientifique, B.P. 166, F-38042 Grenoble Cedex 09, France
  • A.G. M. Jansen Grenoble High Magnetic Field Laboratory, Max-Planck-Institute fur Festkorperforschung and Centre National de la Recherche Scientifique, B.P. 166, F-38042 Grenoble Cedex 09, France
  • ,P. Wyder Grenoble High Magnetic Field Laboratory, Max-Planck-Institute fur Festkorperforschung and Centre National de la Recherche Scientifique, B.P. 166, F-38042 Grenoble Cedex 09, France

DOI:

https://doi.org/10.1063/1.1344146

Ключові слова:

PACS: 72.30. q, 73.40.Jn

Анотація

High-frequency point-contact (PC) spectroscopy is used to investigate the relaxation processes kinetics in the intermetallic rare-earth compound PrNi5. A difference is observed in the spectral response between the conventional low-frequency PC data and the response signal to microwave and farinfrared radiation of PrNi5-Cu point contacts. This difference is connected with the f-shell electronic levels (CEF levels) and phonon temporal dynamics. The phonon reabsorption contribution to the spectra above the Debye energy decreases for microwave and far-infrared frequencies. However, the crystal-field contribution to the spectra at 4.2 meV is enhanced for high frequencies reflecting the relaxation processes specific for these Fermi-statistics electron excitations. The characteristic frequency for CEF-level relaxation is evaluated as ~200 GHz.

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Опубліковано

2001-01-10

Як цитувати

(1)
Balkashin, O. P.; Sukhodub, G. L.; Yanson, I. K.; Brill, T. M.; Jansen, A. M.; Wyder, ,P. Relaxation Dynamics in the High-Frequency Crystal-Field Spectroscopy of PrNi5 Point Contacts. Fiz. Nizk. Temp. 2001, 27, 90-95.

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