VEREMEICHYK, T. V. .; MAKARENKO, O. V. .; SHEVCHENKO, V. B. .; IVANCHUK, S. Y. .; RYBALOCHKA, A. V. . Investigation of multilayer samples of porous silicon with periodic structure by spectroscopic ellipsometry . ФІЗИКА НИЗЬКИХ ТЕМПЕРАТУР, Харків, Україна, v. 51, n. 2, p. 261–266, 2024. Disponível em: https://fnt.ilt.kharkov.ua/index.php/fnt/article/view/9404. Acesso em: 28 груд. 2024.