IVANOV, Z.; FOGEL, N.; YUZEPHOVICH, O.; STEPANTSOV, E.; TZALENCHUK, A. Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O_7–d microbridges and bicrystal junctions. ФІЗИКА НИЗЬКИХ ТЕМПЕРАТУР, Харків, Україна, v. 30, n. 3, p. 276–281, 2004. DOI: 10.1063/1.1645178. Disponível em: https://fnt.ilt.kharkov.ua/index.php/fnt/article/view/f30-0276e. Acesso em: 21 лис. 2024.