T. V. Veremeichyk, O. V. Makarenko, V. B. Shevchenko, S. Y. Ivanchuk, and A. V. Rybalochka, Investigation of multilayer samples of porous silicon with periodic structure by spectroscopic ellipsometry , Low Temp. Phys. 51, 239–243, (2025) [Fiz. Nyzk. Temp. 51, 261–266, (2025)] DOI: https://doi.org/10.1063/10.0035408.