Low Temperature Physics: 32, 877 (2006); https://doi.org/10.1063/1.2356845 (8 pages)
Fizika Nizkikh Temperatur: Volume 32, Number 8-9 (August 2006), p. 1155-1164    ( to contents , go back )

Stability of the charged liquid dielectric surface

L. Kushnir and V.Shikin

Institute of Solid State Physics RAS, Chernogolovka 142432, Moscow Region, Russia
E-mail: Kushnir_lv@mail.ru
pos Анотація:

Received December 30, 2005, revised February 15, 2006


Two liquid dielectrics interface normal to external electric field is investigated. The origin of instability of this system for different parameters (such as ratio of permittivity of two media, thickness of liquid films etc.) is described. A mechanically equilibrium state of the curved interface under supercritical circumstances may occur. The period of deformation appeared crucially depends on the value of e and tends to infinity when e → 0 (which corresponds to the infinite conductivity of one of the media). The amplitude of this corrugation depends on supercriticality of electric field (the difference between actual and critical values). We highlight two different ways of the interface curving process — «smooth» and «tough» ones (for details see equation (30) and the comments) which appear under particular correlation between the external parameters. The method used is applicable only if the «smooth» case takes place. It is mentioned that the manipulations with the parameter face=`Symbol`>e = e1/e2 in the problem under consideration are equivalent to the variation of charged particles occupancy degree d of the cryogenic liquid surface. The maximum value d=1 corresponds to the case of free surface of conductive liquid.

67.40.Pm -
47.27.Eq -

Key words: charged liquid dielectric, instability, reconstruction.

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