BORYAK, O. A. .; SHELKOVSKY, V. S. .; ORLOV, V. V. .; ZOBNINA, V. G. .; KOSEVICH , M. V. . Advantages of the low-temperature secondary emission mass spectrometry in analysis of metal ions in water samples revisited . ФІЗИКА НИЗЬКИХ ТЕМПЕРАТУР, Харків, Україна, v. 50, n. 3, p. 255–261, 2024. DOI: 10.1063/10.0024963. Disponível em: http://fnt.ilt.kharkov.ua/index.php/fnt/article/view/9205. Acesso em: 21 груд. 2024.