Low Temperature Physics: 36, 821 (2010); https://doi.org/10.1063/1.3499251 (5 pages)
Физика Низких Температур: Том 36, Выпуск 8-9 (Август 2010), c. 1029-1033 ( к оглавлению , назад )
Magnetic properties of amorphous Co0.74Si0.26/Si multilayers with different number of periods
G.N. Kakazei1,2,4, N.M. Santos3, C. Quiros2, M. Velez2, J.I. Martin2, J.M. Alameda2, V.O. Golub4
O.Y. Saliuk4, Yu.G. Pogorelov1, M.C. Carmo3, N.A. Sobolev3, and J.B. Sousa1
1IFIMUP and IN-Institute of Nanoscience and Nanotechnology, Departamento de Fнsica da Faculdade de Ciкncias Universidade do Porto, Porto 4169-007, Portugal
2Departamento de Fisica, Universidad de Oviedo, Oviedo 33007, Spain
4Institute of Magnetism of the National Academy of Sciences of Ukraine
Received February 19, 2010
Two sets of [Co0.74Si0.26(5 nm)/Si(s)]n amorphous films were prepared by magnetron sputtering: one in the form of multilayers with the Si spacer thickness s fixed at 3 nm, and the number of periods n varying from 1 to 10; and another one with only two periods and s varying from 3 to 24 nm (trilayers). In both series, the Co0.74Si0.26 layer thickness t was fixed at 5 nm. All the samples except the one with s = 24 nm demonstrate antiferromagnetic coupling. Their magnetic properties at room temperature were probed by magnetooptical transverse Kerr effect (MOTKE) and ferromagnetic resonance (FMR). The relative increase of the saturation magnetization Ms (for trilayers with respect to the one with s = 24 nm; for multilayers with respect to the single layer one) obtained from the FMR measurements was compared with the exchange coupling strength HJAF obtained from the MOTKE studies. HJAF and Ms dependencies vs n and s were found to be very similar to each other. Possible mechanisms of this similarity are discussed.
PACS: 75.70.Cn Magnetic properties of interfaces;
Key words: magnetic multilayers, amorphous films, ferromagnetic resonance, antiferromagnetic coupling.