1IFIMUP and IN-Institute of Nanoscience and Nanotechnology, Departamento de Fнsica da Faculdade de Ciкncias Universidade do Porto, Porto 4169-007, Portugal
2Departamento de Fisica, Universidad de Oviedo, Oviedo 33007, Spain 3I3N and Departamento de Física, Universidade de Aveiro, Aveiro 3810-193, Portugal
4Institute of Magnetism of the National Academy of Sciences of Ukraine pos Анотація:
Received February 19, 2010
Two sets of [Co0.74Si0.26(5 nm)/Si(s)]n amorphous films were prepared by magnetron sputtering: one in the
form of multilayers with the Si spacer thickness s fixed at 3 nm, and the number of periods n varying from 1 to 10; and another one with only two periods and s varying from 3 to 24 nm (trilayers). In both series, the
Co0.74Si0.26 layer thickness t was fixed at 5 nm. All the samples except the one with s = 24 nm demonstrate antiferromagnetic coupling. Their magnetic properties at room temperature were probed by magnetooptical transverse Kerr effect (MOTKE) and ferromagnetic resonance (FMR). The relative increase of the saturation magnetization Ms (for trilayers with respect to the one with s = 24 nm; for multilayers with respect to the single layer one) obtained from the FMR measurements was compared with the exchange coupling strength
HJAF obtained from the MOTKE studies. HJAF and Ms dependencies vs n and s were found to be very similar to each other. Possible mechanisms of this similarity are discussed.
PACS: 75.70.Cn Magnetic properties of interfaces; PACS: 75.50.Kj Amorphous and quasicrystalline magnetic materials; PACS: 76.50.+g Ferromagnetic, antiferromagnetic, and ferrimagnetic resonances; spin-wave resonance; PACS: 71.70.Gm Exchange interactions.